New X-ray imaging technique could double scanning efficiency while revealing hidden detail
Researchers at Monash University have developed a new X-ray imaging technique that can image two overlapping samples at the same time, potentially doubling scanning efficiency while opening new possibilities for industrial inspection and scientific research.
Researchers at Monash University have developed a new X-ray imaging technique that can image two overlapping samples at the same time, potentially doubling scanning efficiency while opening new possibilities for industrial inspection and scientific research. This story matters for Science & Discovery readers tracking science. Reported by phys.org. Read the full original at the source link below.
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